𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Measurement of useful properties of memory devices

✍ Scribed by Barker, R.; Kmetz, A.


Book ID
117920309
Publisher
IEEE
Year
1965
Tongue
English
Weight
453 KB
Volume
1
Category
Article
ISSN
0018-9464

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Measuring mechanical properties of fine-
✍ Yu, Ning ;Polycarpou, Andreas A. ;Wagoner Johnson, Amy J. πŸ“‚ Article πŸ“… 2004 πŸ› John Wiley and Sons 🌐 English βš– 419 KB

## Abstract In this study, it was demonstrated that the nanoindentation technique can be used to measure the elastic modulus and hardness of fine‐wire cross‐sections with diameters ranging from 100–200 ΞΌm. Using miniature optics and a specially developed micrometer positioning system, measurements