Measurement of thickness and conductivity of a thin film during the process of its evaporation: V A Sterkhov and N D Tokarev, Izmerit Tekh, No 4, 1974, 45–47 (in Russian)

• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 164 KB
• Volume: 25
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(75)90807-6