Measurement of the thickness of dielectric thin films on silicon photodetectors using the angular response to incident linearly polarized light

✍ Scribed by Azzam, R.M.A.; Howlader, M.M.K.

• Book ID: 114543004
• Publisher: IEEE
• Year: 1994
• Tongue: English
• Weight: 382 KB
• Volume: 43
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/19.368064