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Measurement of the temperature dependence of the I/SUB C/(V/SUB be/) characteristics of integrated bipolar transistors

✍ Scribed by Meijer, G.C.M.; Vingerling, K.

Book ID: 119797921
Publisher: IEEE
Year: 1980
Tongue: English
Weight: 698 KB
Volume: 15
Category: Article
ISSN: 0018-9200
DOI: 10.1109/jssc.1980.1051368

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