Calculated Elemental Sputter Yield Corre
β
Malherbe, Johan B.; Quintin Odendaal, R.
π
Article
π
1997
π
John Wiley and Sons
π
English
β 239 KB
π 1 views
Ion bombardment usually leads to a change in the equilibrium sputtered surface composition of compound semiconductors. This change is matrix dependent. To compensate for this sputter-induced e β ect in quantitative AES, a sputter yield correction factor is usually employed. This factor is based on th