Measurement of the spatial resolution of double-sided double-metal AC-coupled silicon microstrips detectors

✍ Scribed by R. Brenner; R. Harr; A. Rudge; D. Santos; J. Straver; P. Weilhammer; A. Czermak; S. Gadomski; M. Turala; V. Bonvicini; W. Kucewicz; S. Masciocchi; G. Vegni; A. Peisert; J. Ardelan; A. Hrisoho; K. Troung; F. Couchot; C. Colledani; W. Dulinski; D. Husson; A. Lounis; N. Mayet; M. Schaeffer; R. Turchetta; A. Smith; R. Apsimon; P. Seller; M. Tyndel; M. Aalste; I. Hietanen; J. Lindgren; K. Osterberg; R. Orava; C. Ronnqvist; T. Tuuva; M. Voutilainen

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 737 KB
• Volume: 326
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/0168-9002(93)90350-q