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Measurement of the minority-carrier transport parameters in heavily doped silicon

✍ Scribed by Mertens, R.P.; Van Meerbergen, J.L.; Nijs, J.F.; Van Overstraeten, R.J.

Book ID: 114593406
Publisher: IEEE
Year: 1980
Tongue: English
Weight: 745 KB
Volume: 27
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1980.19962

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