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Measurement of the minority-carrier lifetime using an MOS capacitor

✍ Scribed by Ching-Yeu Wei; Woodbury, H.H.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

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✍ Heiman, F.P. 📂 Article 📅 1967 🏛 IEEE 🌐 English ⚖ 356 KB

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✍ L. Fonseca; F. Campabadal 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 199 KB

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