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Measurement of the layer thickness on rotating substrates in molecular-beam epitaxy apparatus

✍ Scribed by S. E. Aleksandrov; G. A. Gavrilov; G. Yu. Sotnikova; A. N. Alekseev; D. A. Baranov; A. P. Shkurko


Book ID
111448561
Publisher
Springer
Year
2009
Tongue
English
Weight
181 KB
Volume
54
Category
Article
ISSN
1063-7842

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