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Measurement of the electron mean free path using a bending effect

✍ Scribed by E. P. Stillwell; M. J. Skove; D. R. Overcash; W. B. Gettys


Book ID
112747444
Publisher
Springer
Year
1969
Tongue
English
Weight
476 KB
Volume
9
Category
Article
ISSN
1434-6036

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