Inelastic mean free path measurements of electrons near nickel surfaces
✍ Scribed by B. Lesiak; A. Jablonski; J. Zemek; P. Jiricek; P. Lejcek; M. Cernanský
- Publisher
- John Wiley and Sons
- Year
- 2000
- Tongue
- English
- Weight
- 136 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0142-2421
No coin nor oath required. For personal study only.
📜 SIMILAR VOLUMES
We have performed an evaluation of calculated and measured electron inelastic mean free paths (IMFPs) for selected materials and for electron energies between 50 eV and 10 000 eV. This evaluation is based on IMFPs calculated from experimental optical data and on IMFPs measured by elastic-peak electr
Gries has recently reported [ Surf. Interface Anal. 24, 38 (1996) ] an atomistic model for inelastic electron scattering relevant to Auger electron spectroscopy and x-ray photoelectron spectroscopy and has derived an equation (designated G1) for the estimation of inelastic mean free paths (IMFPs). W
Intensity ratios of electrons backscattered elastically from thick, amorphous Si, polycrystalline Ag and Au, as well as various (vacuum evaporated, electrodeposited layers and metallic sheets) polycrystalline Ni samples, were measured using high energy resolution and two different experimental geome