Measurement of the drift velocity of holes in silicon at high-field strengths : V. Rodriguez, H. Ruegg and M-A. Nicolet, IEEE Trans.ED-14, No. 1. January (1967), p. 44.

• Publisher: Elsevier Science
• Year: 1967
• Tongue: English
• Weight: 205 KB
• Volume: 6
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(67)90127-8