Measurement of high-field carrier drift velocities in silicon by a time-of-flight technique : C. B. Norris Jr. and J. F. Gibbons, IEEE Trans.ED-14, No. 1. January (1967), p. 38.

• Publisher: Elsevier Science
• Year: 1967
• Tongue: English
• Weight: 105 KB
• Volume: 6
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(67)90128-x