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Measurement of the differential and integral distribution of diffuse x-ray scattering intensity from defects in thin strained layers

✍ Scribed by R. N. Kyutt

Book ID: 110118251
Publisher: SP MAIK Nauka/Interperiodica
Year: 1997
Tongue: English
Weight: 106 KB
Volume: 39
Category: Article
ISSN: 1063-7834
DOI: 10.1134/1.1130155

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