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Measurement of the density and the thermal expansion coefficient of molten silicon using electromagnetic levitation

✍ Scribed by Mario Langen; Taketoshi Hibiya; Minoru Eguchi; Ivan Egry


Book ID
108342596
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
237 KB
Volume
186
Category
Article
ISSN
0022-0248

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High resolution measurement of the therm
✍ BrΓΌser, B. ;Panzner, T. ;Grigorian, S. ;Grenzer, J. ;Zorn, M. ;Zeimer, U. ;Piets πŸ“‚ Article πŸ“… 2008 πŸ› John Wiley and Sons 🌐 English βš– 381 KB

## Abstract We measured the thermal expansion coefficient (TEC) of a vertically stacked multi‐quantum‐well (MQW) structure buried under a thick GaAs top layer before and after lateral patterning of the GaAs top layer. After patterning the TEC of the whole MQW structure differs from that of the plan