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Measurement of the BJT activation current during the reverse recovery of power MOSFET's drain-source diode

✍ Scribed by Iannuzzo, F.; Persiano, G.V.; Busatto, G.

Book ID: 114538581
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 89 KB
Volume: 48
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.902744

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