๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Measurement of the activation energy of the low temperature oxidation of coal using secondary ion mass spectrometry

โœ Scribed by Ronald R. Martin; J.Anthony MacPhee; Mark Workinton; Elizabeth Lindsay


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
386 KB
Volume
68
Category
Article
ISSN
0016-2361

No coin nor oath required. For personal study only.

โœฆ Synopsis


the precision and accuracy data obtained for quantitative analysis of total aromatics in different samples.

Conclusions

The method described in this work can be applied to the determination of total aromatics in straight-run and cracked petroleum fractions boiling up to 215ยฐC. The quantitative values for total aromatics were found to be in good agreement with the results obtained from acid extraction.

Therefore, considering the rapidity and reliability of the method, it can be used for routine analysis.

REFERENCES


๐Ÿ“œ SIMILAR VOLUMES


An investigation of the SO2Ag surface re
โœ M. Barber; P. Sharpe; J.C. Vickerman ๐Ÿ“‚ Article ๐Ÿ“… 1974 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 245 KB

The interaction of SO\* and of SOz + O2 mixtures with Ag surfaces has been investigated using secondary ion mass spectroscopy. The SOz/Ag system gave spectra which were largely composed of AgSO:, AgSOz and AgzS+ ions, indicative of the formation of S and SO4 species in the reaction. In the case of

Quantitative secondary ion mass spectrom
โœ Yamazaki, Hideyuki; Takahashi, Mamoru ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 262 KB ๐Ÿ‘ 2 views

Quantitative analysis of the native oxide on silicon wafers has been investigated by secondary ion mass spectrometry (SIMS) combined with an encapsulation method. In the encapsulation technique, the sample surface is covered with a thin รlm whose material is identical to that of the substrate of the