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Measurement of surface polaritons by spectroscopic infrared ellipsometry

✍ Scribed by Röseler, A.


Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
174 KB
Volume
107
Category
Article
ISSN
0031-8965

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Spectroscopic ellipsometry measurements
✍ Tompkins, Harland G.; Tasic, Sonja; Baker, Jeff; Convey, Diana 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 151 KB 👁 2 views

Optical methods are used to determine the thickness of thin metal films, with emphasis on spectroscopic ellipsometry and transmission. We discuss the conditions where this is possible and how to determine the optical constants for the material. The determination of the thickness of each of two metal