Measurement of standard deviation of threshold voltage by using parallel-connected MOSFETs

✍ Scribed by Kazuo Terada; Tohru Mogami

• Book ID: 102662208
• Publisher: John Wiley and Sons
• Year: 1997
• Tongue: English
• Weight: 878 KB
• Volume: 80
• Category: Article
• ISSN: 8756-663X
• DOI: 10.1002/(sici)1520-6432(199701)80:1<11::aid-ecjb2>3.0.co;2-c