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Measurement of solid–liquid interface temperature during pulsed excimer laser melting of polycrystalline silicon films

✍ Scribed by Xu, Xianfan; Grigoropoulos, Costas P.; Russo, Richard E.


Book ID
120219638
Publisher
American Institute of Physics
Year
1994
Tongue
English
Weight
315 KB
Volume
65
Category
Article
ISSN
0003-6951

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