Measurement of resistivity and mobility in silicon epitaxial layers on a control wafer : W. J. Patrick. Solid-State Electronics9 (1966), p. 203

• Book ID: 113190430
• Publisher: Elsevier Science
• Year: 1966
• Tongue: English
• Weight: 98 KB
• Volume: 5
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(66)90189-2