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Measurement of oxygen adsorption on silicon by ellipsometry

✍ Scribed by R.J. Archer; G.W. Gobeli

Publisher: Elsevier Science
Year: 1964
Tongue: English
Weight: 45 KB
Volume: 2
Category: Article
ISSN: 0038-1098
DOI: 10.1016/0038-1098(64)90347-3

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