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Measurement of oxygen adsorption on silicon by ellipsometry

✍ Scribed by R.J. Archer; G.W. Gobeli

Publisher: Elsevier Science
Year: 1965
Tongue: English
Weight: 764 KB
Volume: 26
Category: Article
ISSN: 0022-3697
DOI: 10.1016/0022-3697(65)90163-0

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