Measurement of optical properties of highly doped silicon by terahertz time domain reflection spectroscopy

✍ Scribed by Nashima, S.; Morikawa, O.; Takata, K.; Hangyo, M.

• Book ID: 111885274
• Publisher: American Institute of Physics
• Year: 2001
• Tongue: English
• Weight: 293 KB
• Volume: 79
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.1413498