Far-infrared dielectric constant of porous silicon layers measured by terahertz time-domain spectroscopy

✍ Scribed by Labbé-Lavigne, S.; Barret, S.; Garet, F.; Duvillaret, L.; Coutaz, J.-L.

• Book ID: 126944452
• Publisher: American Institute of Physics
• Year: 1998
• Tongue: English
• Weight: 81 KB
• Volume: 83
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.367467