Measurement of minority carrier lifetime in GaAs and GaAs1−xPx with an intensity-modulated electron beam: J. Pietzsch. Solid-St. Electron.25 (4), 295 (1982)

• Book ID: 107829700
• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 134 KB
• Volume: 23
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(83)91505-6