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Measurement of minority carrier lifetime in GaAs and GaAs1−xPx with an intensity-modulated electron beam

✍ Scribed by J. Pietzsch

Publisher: Elsevier Science
Year: 1982
Tongue: English
Weight: 733 KB
Volume: 25
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(82)90138-1

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📂 Article 📅 1976 🏛 Elsevier Science 🌐 English ⚖ 152 KB