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2219. Measurements of diffusion length of minority carriers with the aid of an electron beam: V I Kononov et al,Coll of Works on Semicon Materials, Dev and Applic, Voronezh, 1973, 182–184 (in Russian)


Publisher
Elsevier Science
Year
1976
Tongue
English
Weight
152 KB
Volume
26
Category
Article
ISSN
0042-207X

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