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Measurement of local thickness of oxide layer and its electronic characteristics by scanning tunneling microscopy

✍ Scribed by Gatin, A. K.; Grishin, M. V.; Kirsankin, A. A.; Kozhushner, M. A.; Posvyanskii, V. S.; Kharitonov, V. A.; Shub, B. R.

No coin nor oath required. For personal study only.

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