Annealing effects on the microstructure of sputtered gold layers on oxidized silicon investigated by scanning electron microscopy and scanning probe microscopy

✍ Scribed by Plaza, J. L.; Jacke, S.; Chen, Y.; Palmer, R. E.

• Book ID: 126838099
• Publisher: Taylor and Francis Group
• Year: 2003
• Tongue: English
• Weight: 195 KB
• Volume: 83
• Category: Article
• ISSN: 1478-6435
• DOI: 10.1080/0141861031000072006