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Measurement of inter-particle forces by an interfacial force microscope

โœ Scribed by Qing Huang; Asghar Mesbah-Nejad; Seyed M. Tadayyon; Peter Norton; Hui Zhang; Jesse Zhu


Book ID
108234183
Publisher
Elsevier
Year
2010
Tongue
English
Weight
646 KB
Volume
8
Category
Article
ISSN
1674-2001

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The atomic force microscope (AFM) continues to fi nd increasing applications in nanoscale imaging, [ 1 ] metrology, [ 2 ] devices, [ 3 ] and manufacturing. [ 4 ] In these applications, tip size and shape critically affect the accuracy, resolution, and reliability of measurements and processes. [ 5 ]