Measurement of hole leakage and impact ionization currents in bistable metal—tunnel-oxide—semiconductor junctions

✍ Scribed by Fossum, E.R.; Barker, R.C.

• Book ID: 114594838
• Publisher: IEEE
• Year: 1984
• Tongue: English
• Weight: 764 KB
• Volume: 31
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1984.21683