Measurement of Forbidden Energy Gap of Semiconductors by Diffuse Reflectance Technique

✍ Scribed by S. P. Tandon; J. P. Gupta

• Book ID: 104539355
• Publisher: John Wiley and Sons
• Year: 1970
• Tongue: English
• Weight: 236 KB
• Volume: 38
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/pssb.19700380136

✦ Synopsis

Abstract

Diffuse reflectance technique for the measurement of forbidden energy gap, E~g~, is discussed. The energy coordinate of the point at which the linear increase in the Kubelka‐Munk function starts gives the E~g~‐value. The E~g~‐values of fifteen semiconductors are reported. These E~g~‐values are found to be in good agreement with those measured by other methods.