๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Characterization of semiconductor oxides by IR diffuse reflectance spectroscopy

โœ Scribed by Kaori Matsuo; Katsuyuki Nakano

Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
255 KB
Volume
41-42
Category
Article
ISSN
0169-4332

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Evaluation of emulsion stability by diff
Evaluation of emulsion stability by diffuse reflectance spectroscopy
โœ Michael J. Akers; John L. Lach ๐Ÿ“‚ Article ๐Ÿ“… 1976 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 637 KB

A new method is described for evaluating the stability of emulsion bases and active components contained within such emulsions. Diffuse reflectance spectroscopy (DRS) is a technique that has the capability of detecting changes in particle size, surface properties, or drug quality of emulsions as a f