Measurement of effective carrier lifetime at the semiconductor–dielectric interface by Photoconductive Decay (PCD) Method

✍ Scribed by Drummond, P.J.; Bhatia, D.; Ruzyllo, J.

• Book ID: 121425620
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 499 KB
• Volume: 81
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/j.sse.2012.11.007