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Measurement of Contact Potential of GaAs/AlGaAs Heterostructure Using Kelvin Probe Force Microscopy

✍ Scribed by Mizutani, Takashi; Usunami, Takao; Kishimoto, Shigeru; Maezawa, Koichi

Book ID: 124076285
Publisher: Institute of Pure and Applied Physics
Year: 1999
Tongue: English
Weight: 231 KB
Volume: 38
Category: Article
ISSN: 0021-4922
DOI: 10.1143/JJAP.38.L767

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