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Microscopic investigation of InGaN/GaN heterostructure laser diode degradation using Kelvin probe force microscopy

✍ Scribed by Lochthofen, A; Mertin, W; Bacher, G; Furitsch, M; Brüderl, G; Strauss, U; Härle, V

Book ID: 120489820
Publisher: Institute of Physics
Year: 2008
Tongue: English
Weight: 659 KB
Volume: 41
Category: Article
ISSN: 0022-3727
DOI: 10.1088/0022-3727/41/13/135115

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