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Measurement of angle-resolved X-ray scattering from synthetic multilayers

✍ Scribed by Tetsuya Ishikawa; Atsuo Iida; Tadashi Matsushita

Publisher: Elsevier Science
Year: 1986
Tongue: English
Weight: 294 KB
Volume: 246
Category: Article
ISSN: 0168-9002
DOI: 10.1016/0168-9002(86)90104-x

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