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Measurement and Parameterization of Carrier Mobility Sum in Silicon as a Function of Doping, Temperature and Injection Level

โœ Scribed by Zheng, P.; Rougieux, F. E.; Macdonald, D.; Cuevas, A.


Book ID
125467192
Publisher
Institute of Electrical and Electronics Engineers
Year
2014
Tongue
English
Weight
531 KB
Volume
4
Category
Article
ISSN
2156-3381

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