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Measurement and modeling of self-heating in SOI nMOSFET's

โœ Scribed by Su, L.T.; Chung, J.E.; Antoniadis, D.A.; Goodson, K.E.; Flik, M.I.


Book ID
114535570
Publisher
IEEE
Year
1994
Tongue
English
Weight
702 KB
Volume
41
Category
Article
ISSN
0018-9383

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