Measured equation of invariance based on wavelet transform technique
β Scribed by Byungje Lee; Frances J. Harackiewicz; Jong-Chul Lee; Jong-Heon Kim; Nam-Young Kim
- Publisher
- John Wiley and Sons
- Year
- 2002
- Tongue
- English
- Weight
- 105 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0895-2477
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β¦ Synopsis
Abstract
Wavelets have been applied in conjunction with the measured equation of invariance (MEI) to solve a twoβdimensional scattering problem. The MEI method with wavelet metrons is referred to as the wavelet MEI method. Haar wavelets are used as metrons. The proposed method leads to a significant savings in CPU time compared to the standard MEI method that does not use wavelets as metrons. Β© 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 33: 47β49, 2002; DOI 10.1002/mop.10227
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