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Mean escape depth of secondary electrons emitted from semiconductors and insulators

✍ Scribed by A. G. Xie, S. R. Xiao, H. Y. Wu

Book ID: 120671315
Publisher: Springer-Verlag
Year: 2013
Tongue: English
Weight: 226 KB
Volume: 87
Category: Article
ISSN: 0019-5480
DOI: 10.1007/s12648-013-0355-8

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