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Total Yield and Escape Depth of Electrons from Heavy Ion Solid Interactions

✍ Scribed by Frischkorn, H. J.; Koschar, P.; Latz, R.; Schader, J.; Burkhard, M.; Hofmann, D.; Groeneveld, K. O.

Book ID: 114662627
Publisher: IEEE
Year: 1983
Tongue: English
Weight: 317 KB
Volume: 30
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.1983.4332417

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