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Maximum applied voltage detector using amorphous In–Ga–Zn–O thin-film transistor exposed to ozone annealing

✍ Scribed by Mutsumi Kimura; Takayuki Hasegawa; Keisuke Ide; Kenji Nomura; Toshio Kamiya; Hideo Hosono

Book ID: 116890880
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 738 KB
Volume: 75
Category: Article
ISSN: 0038-1101
DOI: 10.1016/j.sse.2012.04.037

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