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Matrix cracking of composites inside a scanning electron microscope

✍ Scribed by P. A. Smith; D. G. Gilbert; A. Poursartip


Publisher
Springer
Year
1985
Tongue
English
Weight
292 KB
Volume
4
Category
Article
ISSN
0261-8028

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In nanoprobing measurements the quality of the electrical contact strongly depends on the contact force. Probing semiconductors such as silicon requires applying very high and stable forces to establish an ohmic contact between the probe tip and the structure under study. Therefore, a compact force