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Mathematical model of charge and density distributions in interfacial polymerization of thin films

✍ Scribed by V. Freger; S. Srebnik

Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
142 KB
Volume
88
Category
Article
ISSN
0021-8995

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## Abstract We control and vary the roughness of a dielectric upon which a high‐performance polymer semiconductor, poly(2,5‐bis(3‐alkylthiophen‐2‐yl)thieno[3,2‐__b__]thiophene) (pBTTT) is cast, to determine the effects of roughness on thin‐film microstructure and the performance of organic field‐ef