The Effect of Interfacial Roughness on t
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Jung, Youngsuk (author);Joseph Kline, R. (author);Fischer, Daniel A. (author);Kl
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Article
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2008
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John Wiley and Sons
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English
β 443 KB
π 2 views
## Abstract We control and vary the roughness of a dielectric upon which a highβperformance polymer semiconductor, poly(2,5βbis(3βalkylthiophenβ2βyl)thieno[3,2β__b__]thiophene) (pBTTT) is cast, to determine the effects of roughness on thinβfilm microstructure and the performance of organic fieldβef