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The Effect of Interfacial Roughness on the Thin Film Morphology and Charge Transport of High-Performance Polythiophenes

✍ Scribed by Jung, Youngsuk (author);Joseph Kline, R. (author);Fischer, Daniel A. (author);Kline, R. Joseph (author);Heeney, Martin (author);McCulloch, Lain (author);DeLongchamp, Dean M. (author)


Publisher
John Wiley and Sons
Year
2008
Tongue
English
Weight
443 KB
Volume
18
Category
Article
ISSN
1616-301X

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The Effect of Interfacial Roughness on t
✍ Jung, Youngsuk (author);Joseph Kline, R. (author);Fischer, Daniel A. (author);Kl πŸ“‚ Article πŸ“… 2008 πŸ› John Wiley and Sons 🌐 English βš– 443 KB πŸ‘ 2 views

## Abstract We control and vary the roughness of a dielectric upon which a high‐performance polymer semiconductor, poly(2,5‐bis(3‐alkylthiophen‐2‐yl)thieno[3,2‐__b__]thiophene) (pBTTT) is cast, to determine the effects of roughness on thin‐film microstructure and the performance of organic field‐ef