Sedky (physics, The American University, Cairo, Egypt) investigates the possibility of developing high-quality MEMS structural layers at temperatures compatible with the standard CMOS backend. He first reviews MEMS fabrication technologies, then defines the maximum thermal budget that can be accommo
Materials & Process Integration for MEMS
โ Scribed by Paul Muralt, Nicolas Ledermann (auth.), Francis E. H. Tay (eds.)
- Publisher
- Springer US
- Year
- 2002
- Tongue
- English
- Leaves
- 302
- Series
- Microsystems 9
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
โฆ Synopsis
The field of materials and process integration for MEMS research has an extensive past as well as a long and promising future. Researchers, academicians and engineers from around the world are increasingly devoting their efforts on the materials and process integration issues and opportunities in MEMS devices. These efforts are crucial to sustain the long-term growth of the MEMS field. The commercial MEMS community is heavily driven by the push for profitable and sustainable products. In the course of establishing highยญ volume and low-cost production processes, the critical importance of materials properties, behaviors, reliability, reproducibility, and predictability, as well as process integration of compatible materials systems become apparent. Although standard IC fabrication steps, particularly lithographic techniques, are leveraged heavily in the creation of MEMS devices, additional customized and novel micromachining techniques are needed to develop sophisticated MEMS structures. One of the most common techniques is bulk micromachining, by which micromechanical structures are created by etching into the bulk of the substrates with either anisotropic etching with strong alk:ali solution or deep reactive-ion etching (DRIB). The second common technique is surface micromachining, by which planar microstructures are created by sequential deposition and etching of thin films on the surface of the substrate, followed by a fmal removal of sacrificial layers to release suspended structures. Other techniques include deep lithography and plating to create metal structures with high aspect ratios (LIGA), micro electrodischarge machining (J.
โฆ Table of Contents
Front Matter....Pages N3-xix
Integration of Piezoelectric Pb(Zr x Ti 1-x )O 3 (PZT) Thin Films into Micromachined Sensors and Actuators....Pages 1-24
Porous Silicon as a Sacrificial Layer in Production of Silicon Diaphragms by Precision Grinding....Pages 25-50
GaAs Cantilever and Bridge Membrane-Like Structures Fully Compatible with AlGaAs/InGaAs/GaAs and InGaP/InGaAs/GaAs Based HFETs....Pages 51-75
Magnetron Sputtered TiNiCu Shape Memory Alloy Thin Film for MEMS Applications....Pages 77-96
Chemically Amplified Resist for Micromachining Using X-Ray Lithography....Pages 97-111
Self-Assembled Monolayers (SAM) for Tunneling Sensors....Pages 113-132
Oxidation Process-Optimization for Large Area Silicon Fusion Bonded Devices and MEMS Structures....Pages 133-156
Silicon Nanomachining by Scanning Probe Lithography and Anisotropic Wet Etching....Pages 157-174
A Novel Bulk Micromachining Method in Gallium Arsenide....Pages 175-184
Deep X-ray Lithography for MEMS โ Photoelectron Exposure of the Upper and Bottom Resist Layers....Pages 185-202
Spray Coating Technology of Photoresist/Polymer for 3-D Patterning and Interconnect....Pages 203-229
Uncooled Infrared Image Sensor of Dielectric Bolometer Mode Using Ferroelectric BST Thin Film Prepared by Metal Organic Decomposition....Pages 231-256
Tactical Grade MEMS Gyroscopes Fabricated by the SBM Process....Pages 257-272
Plasma Etching Techniques to Form High-Aspect-Ratio MEMS Structures....Pages 273-294
Back Matter....Pages 295-299
โฆ Subjects
Characterization and Evaluation of Materials;Mechanics
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