Materials Characterization: Introduction to Microscopic and Spectroscopic Methods

✍ Scribed by Yang Leng(auth.)

• Year: 2008
• Tongue: English
• Leaves: 343
• Category: Library

✦ Synopsis

This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.Content:
Chapter 1 Light Microscopy (pages 1–44):
Chapter 2 X?Ray Diffraction Methods (pages 45–77):
Chapter 3 Transmission Electron Microscopy (pages 79–119):
Chapter 4 Scanning Electron Microscopy (pages 121–144):
Chapter 5 Scanning Probe Microscopy (pages 145–170):
Chapter 6 X?Ray Spectroscopy for Elemental Analysis (pages 171–196):
Chapter 7 Electron Spectroscopy for Surface Analysis (pages 197–224):
Chapter 8 Secondary Ion Mass Spectrometry for Surface Analysis (pages 225–251):
Chapter 9 Vibrational Spectroscopy for Molecular Analysis (pages 253–300):
Chapter 10 Thermal Analysis (pages 301–331):