Materials Characterization: Introduction to Microscopic and Spectroscopic Methods

✍ Scribed by Yang Leng

• Year: 2008
• Tongue: English
• Leaves: 351
• Edition: 1
• Category: Library

✦ Synopsis

This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.

✦ Table of Contents

MATERIALS CHARACTERIZATION Introduction to Microscopic and Spectroscopic Methods......Page 1
Contents......Page 7
Preface......Page 13
1.1.1 Image Formation......Page 15
1.1.2 Resolution......Page 17
1.1.3 Depth of Field......Page 19
1.1.4 Aberrations......Page 20
1.2 Instrumentation......Page 22
1.2.1 Illumination System......Page 23
1.2.2 Objective Lens and Eyepiece......Page 27
1.3.1 Sectioning......Page 29
1.3.2 Mounting......Page 30
1.3.3 Grinding and Polishing......Page 33
1.3.4 Etching......Page 36
1.4.1 Bright-Field and Dark-Field Imaging......Page 39
1.4.2 Phase Contrast Microscopy......Page 40
1.4.3 Polarized Light Microscopy......Page 44
1.4.4 Nomarski Microscopy......Page 48
1.4.5 Fluorescence Microscopy......Page 51
1.5 Confocal Microscopy......Page 52
1.5.1 Working Principles......Page 53
1.5.2 Three-Dimensional Images......Page 55
Questions......Page 57
2.1.1 Generation of X-rays......Page 59
2.1.2 X-ray Absorption......Page 62
2.2.1 Diffraction Geometry......Page 63
2.2.2 Diffraction Intensity......Page 70
2.3 X-ray Diffractometry......Page 72
2.3.1 Instrumentation......Page 73
2.3.2 Samples and Data Acquisition......Page 75
2.3.3 Distortions of Diffraction Spectra......Page 78
2.3.4 Applications......Page 80
2.4.1 Wide Angle Diffraction......Page 85
2.4.2 Wide Angle Scattering......Page 88
Questions......Page 90
3.1 Instrumentation......Page 93
3.1.1 Electron Sources......Page 95
3.1.2 Electromagnetic Lenses......Page 97
3.1.3 Specimen Stage......Page 99
3.2.1 Pre-Thinning......Page 100
3.2.2 Final Thinning......Page 101
3.3 Image Modes......Page 103
3.3.1 Mass-Density Contrast......Page 104
3.3.2 Diffraction Contrast......Page 106
3.3.3 Phase Contrast......Page 110
3.4.1 Selected Area Diffraction Characteristics......Page 115
3.4.2 Single-Crystal Diffraction......Page 117
3.4.4 Kikuchi Lines......Page 122
3.5.1 Wedge Fringe......Page 125
3.5.2 Bending Contours......Page 127
3.5.3 Dislocations......Page 129
Questions......Page 132
4.1.1 Optical Arrangement......Page 135
4.1.2 Signal Detection......Page 137
4.1.3 Probe Size and Current......Page 138
4.2.1 ElectronSpecimen Interactions......Page 143
4.2.2 Topographic Contrast......Page 144
4.2.3 Compositional Contrast......Page 147
4.3.1 Working Distance and Aperture Size......Page 148
4.3.2 Acceleration Voltage and Probe Current......Page 151
4.4 Specimen Preparation......Page 152
4.4.1 Preparation for Topographic Examination......Page 153
4.4.3 Dehydration......Page 156
References......Page 157
Questions......Page 158
5.1 Instrumentation......Page 159
5.1.1 Probe and Scanner......Page 161
5.2.1 Tunneling Current......Page 162
5.2.3 Operational Modes......Page 163
5.2.4 Typical Applications......Page 164
5.3.1 Near-Field Forces......Page 166
5.3.2 Force Sensors......Page 168
5.3.3 Operational Modes......Page 169
5.3.4 Typical Applications......Page 175
5.4.1 Tip......Page 179
5.4.2 Scanner......Page 181
5.4.3 Vibration and Operation......Page 182
Questions......Page 183
6.1 Features of Characteristic X-rays......Page 185
6.1.1 Types of Characteristic X-rays......Page 187
6.1.2 Comparison ofK,L andM Series......Page 189
6.2 X-ray Fluorescence Spectrometry......Page 190
6.2.1 Wavelength Dispersive Spectroscopy......Page 193
6.2.2 Energy Dispersive Spectroscopy......Page 197
6.3.1 Special Features......Page 200
6.3.2 Scanning Modes......Page 201
6.4.1 Qualitative Analysis......Page 203
6.4.2 Quantitative Analysis......Page 205
Questions......Page 209
7.1.1 X-ray Photoelectron Spectroscopy......Page 211
7.1.2 Auger Electron Spectroscopy......Page 212
7.2.1 Ultra-High Vacuum System......Page 215
7.2.2 Source Guns......Page 216
7.2.3 Electron Energy Analyzers......Page 218
7.3.1 Photoelectron Spectra......Page 220
7.3.2 Auger Electron Spectra......Page 222
7.4.1 Qualitative Analysis......Page 223
7.4.2 Quantitative Analysis......Page 233
7.4.3 Composition Depth Profiling......Page 235
References......Page 236
Questions......Page 237
8 Secondary Ion Mass Spectrometry for Surface Analysis......Page 239
8.1.1 Secondary Ion Generation......Page 240
8.1.2 Dynamic and Static SIMS......Page 243
8.2.1 Primary Ion System......Page 244
8.2.2 Mass Analysis System......Page 248
8.3 Surface Structure Analysis......Page 251
8.3.1 Experimental Aspects......Page 252
8.3.2 Spectrum Interpretation......Page 253
8.4.1 Generation of SIMS Images......Page 258
8.5 SIMS Depth Profiling......Page 259
8.5.2 Optimization of Depth Profiling......Page 260
Questions......Page 264
9.1.1 Electromagnetic Radiation......Page 267
9.1.2 Origin of Molecular Vibrations......Page 269
9.1.3 Principles of Vibrational Spectroscopy......Page 271
9.1.4 Normal Mode of Molecular Vibrations......Page 273
9.1.5 Infrared and Raman Activity......Page 275
9.2.1 Working Principles......Page 281
9.2.2 Instrumentation......Page 283
9.2.3 Fourier Transform Infrared Spectra......Page 285
9.2.4 Examination Techniques......Page 287
9.2.5 Fourier Transform Infrared Microspectroscopy......Page 290
9.3 Raman Microscopy......Page 293
9.3.1 Instrumentation......Page 294
9.3.2 Fluorescence Problem......Page 297
9.3.3 Raman Imaging......Page 298
9.3.4 Applications......Page 299
9.4.1 Qualitative Methods......Page 304
9.4.2 Quantitative Methods......Page 311
References......Page 313
Questions......Page 314
10.1.1 Thermal Events......Page 315
10.1.3 Experimental Parameters......Page 317
10.2.1 Working Principles......Page 319
10.2.2 Experimental Aspects......Page 323
10.2.3 Measurement of Temperature and Enthalpy Change......Page 326
10.2.4 Applications......Page 329
10.3 Thermogravimetry......Page 333
10.3.1 Instrumentation......Page 335
10.3.2 Experimental Aspects......Page 336
10.3.3 Interpretation of Thermogravimetric Curves......Page 340
10.3.4 Applications......Page 342
Questions......Page 345
Index......Page 347